Okemos, MI, United States of America

Yiming Deng

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Michigan State University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiming Deng. Retrieved from https://idiyas.com/inventor/yiming-deng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yiming Deng: Innovator in Light-Based Inspection Tools

Introduction

Yiming Deng is an accomplished inventor based in Okemos, MI (US). He has made significant contributions to the field of inspection technology, particularly through his innovative patent related to light-based inspection tools.

Latest Patents

Yiming Deng holds a patent for "Light-based inspection tools for the inspection of the internal surface of a cylindrical structure." This inspection tool features a projector that projects a pattern onto a cylindrical surface. It also includes a first camera that generates an image of the projected pattern, and a controller that creates a surface profile of the cylindrical surface based on the first image. This invention enhances the accuracy and efficiency of inspecting cylindrical structures.

Career Highlights

Yiming Deng is affiliated with Michigan State University, where he contributes to research and development in engineering and technology. His work has garnered attention for its practical applications in various industries.

Collaborations

Yiming collaborates with Mohand Alzuhiri, working together to advance their research and innovations in inspection technologies.

Conclusion

Yiming Deng's contributions to light-based inspection tools exemplify the impact of innovative thinking in engineering. His work not only enhances inspection processes but also showcases the potential for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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