Shenzhen, China

Yilun Li

This inventor holds 1 USPTO granted patent. Top assignee: Honor Device Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yilun Li. Retrieved from https://idiyas.com/inventor/yilun-li-wqut92qo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yilun Li - Innovator in Image Processing Technologies

Introduction

Yilun Li is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of image application technologies. His innovative work focuses on enhancing the capabilities of electronic devices through advanced image processing methods.

Latest Patents

Yilun Li holds a patent for an "Image processing method and electronic device." This application provides a method that enriches the details of images or videos captured by multiple cameras in an electronic device. The technology improves the photographing effect by determining a target zoom ratio based on user input and utilizing overlapping exposure from multiple cameras to generate a high-quality preview image.

Career Highlights

Yilun Li is associated with Honor Device Co., Ltd., where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the functionality of electronic devices, particularly in the realm of photography and image processing.

Collaborations

Yilun Li collaborates with talented individuals such as Hantao Cui and Zirong Wang. Their combined expertise contributes to the innovative projects at Honor Device Co., Ltd.

Conclusion

Yilun Li's contributions to image processing technologies exemplify the impact of innovation in enhancing electronic devices. His work continues to shape the future of photography and image applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…