Rehovot, Israel

Yiftuh Karni

This inventor holds 1 USPTO granted patent. Top assignee: Quantomix Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiftuh Karni. Retrieved from https://idiyas.com/inventor/yiftuh-karni

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Yiftuh Karni: Innovator in SEM Inspection Methods

Introduction

Yiftuh Karni is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of scanning electron microscopy (SEM) through his innovative methods for inspecting fluid-containing samples. His work has implications for various scientific and industrial applications.

Latest Patents

Yiftuh Karni holds a patent for "Methods for SEM inspection of fluid containing samples." This patent describes a method of visualizing a sample in a wet environment. The process involves introducing a sample into a specimen enclosure in a wet environment and scanning the sample in a scanning electron microscope, thereby visualizing the sample effectively. He has 1 patent to his name.

Career Highlights

Karni is associated with Quantomix Ltd., where he applies his expertise in microscopy and sample analysis. His work at the company has positioned him as a key player in advancing SEM technologies.

Collaborations

Throughout his career, Yiftuh has collaborated with talented individuals such as Vered Behar and Amotz Nechushtan. These collaborations have fostered innovation and contributed to the development of new methodologies in the field.

Conclusion

Yiftuh Karni's contributions to the field of scanning electron microscopy highlight his role as an innovator. His patented methods for inspecting fluid-containing samples represent a significant advancement in the technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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