Beijing, China

Yifeng Li

This inventor holds 2 USPTO granted patents and 4 published patent applications. Top assignee: Beijing Youzhuju Network Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yifeng Li. Retrieved from https://idiyas.com/inventor/yifeng-li-g8ygsvtt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Yifeng Li: Inventor in Beijing

Introduction

Yifeng Li is an inventor based in Beijing, China. His patent work includes methods for task execution and object localization, and he is associated with Beijing Youzhuju Network Technology Co., Ltd. His listed portfolio includes 2 patents.

Latest Patents

- Task Execution Method and Apparatus, Device, and Computer Medium. This invention describes displaying acquired environment image information and controlling a holding apparatus to perform a task in response to a user’s operation on that image.

- Method and Apparatus for Object Localization in Discontinuous Observation Scene, and Storage Medium. This invention describes using a benchmark image captured when observation resumes after an interruption to acquire an object model, then associating objects observed before and after the interruption with the help of an object reconstruction model.

Career Highlights

Li’s listed patents address task execution based on user interaction with environmental imagery and object localization across interrupted observations. Both inventions describe methods and apparatuses, alongside related devices or storage media.

Collaborations

Li is associated with Beijing Youzhuju Network Technology Co., Ltd. His listed coworkers include Tao Kong and Guanglin Li.

Conclusion

Yifeng Li’s patent portfolio reflects work on image-guided task execution and object localization in discontinuous observation settings.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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