Hong Kong, China

Yidi Liu

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Smartech Worldwide Limited. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yidi Liu. Retrieved from https://idiyas.com/inventor/yidi-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yidi Liu - Innovator in QC-LDPC Decoding Technology

Introduction

Yidi Liu is a prominent inventor based in Hong Kong, China. He has made significant contributions to the field of coding technology, particularly in the development of a QC-LDPC decoder. His innovative work has garnered attention in the tech community, showcasing his expertise and dedication to advancing technology.

Latest Patents

Yidi Liu holds a patent for a QC-LDPC decoder, which includes a method for performing layered decoding and a storage device. The patent describes a QC-LDPC decoder that features a zero matrix monitoring circuit, a check node processing circuit, a variable node processing circuit, and a check circuit. This invention is designed to enhance the efficiency and reliability of data decoding processes.

Career Highlights

Yidi Liu is currently associated with Smartech Worldwide Limited, where he applies his skills and knowledge to further technological advancements. His work at the company reflects his commitment to innovation and excellence in the field of coding technology.

Collaborations

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Conclusion

Yidi Liu's contributions to QC-LDPC decoding technology exemplify his role as a leading inventor in the industry. His patent and work at Smartech Worldwide Limited highlight his dedication to innovation and the advancement of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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