Hubei, China

Yide Ye

This inventor holds 1 USPTO granted patent. Top assignee: Wuhan University of Technology. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yide Ye. Retrieved from https://idiyas.com/inventor/yide-ye

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yide Ye: Innovator in Motor Measurement and Control Technology

Introduction

Yide Ye is a prominent inventor based in Hubei, China. He has made significant contributions to the field of motor measurement and control technology. His innovative approach has led to the development of a patented method that enhances the precision of motor operations.

Latest Patents

Yide Ye holds a patent for a "Measurement and control method, device, and electronic equipment for motor current and speed." This invention involves a comprehensive method that includes obtaining input speed and current, utilizing a motor measurement and control model, and conducting calculations to achieve precise control of the motor. The method generates accurate reference currents, ensuring effective motor performance.

Career Highlights

Yide Ye is affiliated with Wuhan University, where he continues to advance research in motor control technologies. His work has garnered attention for its practical applications in various electronic devices and systems.

Collaborations

Yide Ye collaborates with notable colleagues, including Linying Chen and Yamin Huang. Their combined expertise contributes to the ongoing development of innovative solutions in the field.

Conclusion

Yide Ye's contributions to motor measurement and control technology exemplify the impact of innovation in engineering. His patented methods pave the way for advancements in motor control systems, enhancing efficiency and accuracy in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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