Meishan, China

Yi Wang

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Crrc Meishan Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Wang. Retrieved from https://idiyas.com/inventor/yi-wang-z1xg4ddd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Yi Wang - Innovator in Tray Loading Technology

Introduction

Yi Wang is a notable inventor based in Meishan, China. He has made significant contributions to the field of loading technology, particularly with his innovative designs that enhance efficiency and functionality.

Latest Patents

Yi Wang holds a patent for a "Double-surface contact tray loading base." This invention features a loading surface and a hook arranged on the outer end of the loading surface. The hook comprises a hook lug and a support plate, which are strategically positioned to form the double-surface contact tray loading base. This design aims to improve the loading process in various applications.

Career Highlights

Yi Wang is currently employed at CRRC Meishan Co., Ltd., where he applies his expertise in engineering and innovation. His work at the company has allowed him to develop practical solutions that address industry needs.

Collaborations

Some of Yi Wang's coworkers include Liao Peng and Jianchao Li. Their collaboration fosters a creative environment that encourages the development of new ideas and technologies.

Conclusion

Yi Wang's contributions to tray loading technology exemplify the impact of innovative thinking in engineering. His patent and work at CRRC Meishan Co., Ltd. highlight his commitment to advancing industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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