Hong Kong, China

Yi Tian

This inventor holds 1 USPTO granted patent. Top assignee: Hong Kong Applied Science and Technology Research Institute. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Tian. Retrieved from https://idiyas.com/inventor/yi-tian-wjbbszby

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Yi Tian - Innovator in Facial Recognition Technology

Introduction

Yi Tian is a prominent inventor based in Hong Kong, China. He has made significant contributions to the field of facial recognition technology. His innovative approach has led to the development of a unique method for facial detection.

Latest Patents

Yi Tian holds a patent for a "Method and apparatus for facial detection using regional similarity distribution analysis." This invention involves a method and apparatus for facial recognition by a computing device. It utilizes an adaptive search window and regional similarity distribution analysis to enhance the accuracy of facial detection.

Career Highlights

Yi Tian is affiliated with the Hong Kong Applied Science and Technology Research Institute Company Limited. His work at this esteemed institution has allowed him to focus on advancing technology in the field of facial recognition.

Collaborations

Some of his notable coworkers include Jinhui Hu and Min Chen. Their collaboration has contributed to the innovative research and development efforts within their organization.

Conclusion

Yi Tian's contributions to facial recognition technology exemplify the impact of innovative thinking in the field. His patent and work at the Hong Kong Applied Science and Technology Research Institute Company Limited highlight his commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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