Zhuhai, China

Yi Tian

This inventor holds 1 USPTO granted patent and 4 published patent applications and 1 EPO patent. Top assignee: Zhuhai Pantum Electronics Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Tian. Retrieved from https://idiyas.com/inventor/yi-tian-kb6ag0he

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yi Tian: Inventor in Zhuhai

Introduction

Yi Tian is an inventor based in Zhuhai, China. His patent work is associated with Zhuhai Pantum Electronics Co., Ltd., and focuses on estimating recording-material consumption in image-forming systems.

Latest Patents

The supplied information lists 1 patent for Yi Tian: “Recording Material Estimation Method, Information Processing Apparatus, and Consumable.” The invention describes sending page-quantity messages and corresponding recording-material consumption messages for multiple job types to an image-forming apparatus. These messages are used to determine the total consumption of recording material in a consumable. The method covers more than one job type, with different page quantities for each type.

Career Highlights

Tian’s listed invention addresses the estimation of consumable use across different kinds of printing jobs. This approach is intended to support more informed tracking of recording-material consumption.

Collaborations

The supplied information identifies Zhuhai Pantum Electronics Co., Ltd. as Tian’s company and names Hao Zhang and Bo Wang as coworkers.

Conclusion

Yi Tian’s listed patent reflects work on estimating recording-material consumption across varied printing jobs, in connection with Zhuhai Pantum Electronics Co., Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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