Incheon, South Korea

Yi Seul Hwang

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Emw Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Seul Hwang. Retrieved from https://idiyas.com/inventor/yi-seul-hwang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Yi Seul Hwang

Introduction

Yi Seul Hwang is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of antenna technology. His innovative designs have the potential to enhance communication systems.

Latest Patents

Yi Seul Hwang holds a patent for an advanced antenna design. The patent describes an antenna that includes a substrate, a feed line formed on one surface of the substrate, a ground plane formed on the other surface, a short-circuit stub that extends from a terminating end of the feed line and contacts the ground plane, and slits formed on the ground plane so as to cross the feed line. This invention showcases his expertise in creating efficient and effective antenna systems. He has 1 patent to his name.

Career Highlights

Hwang is currently employed at Emw Co., Ltd., where he continues to develop innovative technologies. His work at the company has allowed him to collaborate with other talented professionals in the field.

Collaborations

One of his notable coworkers is Kyoung Ho Lee, with whom he has likely shared insights and expertise in their projects.

Conclusion

Yi Seul Hwang's contributions to antenna technology exemplify the spirit of innovation. His patent reflects a commitment to advancing communication systems. His work at Emw Co., Ltd. positions him as a key player in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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