Yi Pan

Title: Yi Pan - Innovator in CNC Machine Tool Measurement Technology

Introduction

Yi Pan is a distinguished inventor based in Dalian, China. He has made significant contributions to the field of dynamic error detection in machine tools. His innovative approach focuses on enhancing measurement accuracy through advanced vision technology.

Latest Patents

Yi Pan holds a patent for a "Monocular vision six-dimensional measurement method for high-dynamic large-range arbitrary contouring error of CNC machine tool." This invention utilizes monocular vision measurement technology combined with short-time stroboscopic illumination and a priori standard plates. The method involves designing a measurement fixture and system, employing a monocular vision pose algorithm to improve the measurable dimensions and range of interpolated contours. By utilizing a small field of view, the method enhances measurement accuracy and allows for the computation of six-dimensional contouring errors.

Career Highlights

Yi Pan is affiliated with Dalian University of Technology, where he continues to advance research in machine tool measurement technologies. His work has garnered attention for its practical applications in improving CNC machine tool performance.

Collaborations

Some of Yi Pan's notable coworkers include Wei Liu and Zhenyuan Jia, who have contributed to his research endeavors.

Conclusion

Yi Pan's innovative work in the field of CNC machine tool measurement exemplifies the importance of advancements in technology for enhancing manufacturing processes. His contributions are paving the way for more accurate and efficient machine tool operations.