Beijing, China

Yi Mo

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Douyin Vision (Beijing) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Mo. Retrieved from https://idiyas.com/inventor/yi-mo-kt51tfhl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yi Mo and an Anniversary Imagery-Record Invention.

Introduction

Yi Mo is an inventor associated with Beijing, China, and Douyin Vision (Beijing) Co., Ltd. The information provided identifies him as a man and lists one patent.

Latest Patents

Yi Mo’s listed patent is “Method and Apparatus for Generating Imagery Record, Electronic Device, and Storage Medium.” The invention describes detecting a triggering period based on a target user’s anniversary and displaying an anniversary card in an application. Selecting the card opens a page for generating an imagery record using template information tied to the anniversary. In response to a user instruction, the system acquires source imagery data and combines it with the template information to generate target imagery data. The supplied information lists 1 patent for Yi Mo.

Career Highlights

The available details connect Yi Mo’s patent work with Douyin Vision (Beijing) Co., Ltd. His listed invention focuses on using anniversary-based templates to help users create personalized imagery records.

Collaborations

Feng Xu is identified as Yi Mo’s coworker. The provided information does not specify whether Feng Xu collaborated on the listed patent.

Conclusion

Yi Mo’s listed patent presents a method for generating personalized imagery records from anniversary-related templates, reflecting his association with invention work at Douyin Vision (Beijing) Co., Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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