Tainan, Taiwan

Yi Hung

This inventor holds 1 USPTO granted patent. Top assignees: Himax Technologies, Inc., Liqxtal Technology Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Hung. Retrieved from https://idiyas.com/inventor/yi-hung-kmwym1qu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Yi Hung - Innovator in Hybrid Depth Detection Technology

Introduction

Yi Hung is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of depth detection technology, particularly through his innovative methods and apparatus.

Latest Patents

Yi Hung holds a patent for a "Method for performing hybrid depth detection with aid of adaptive projector, and associated apparatus." This method involves utilizing an image processing circuit to obtain distance information and determine a distance range. The process includes selecting a projection type based on the distance range and using an adaptive projector to capture images with a camera. The image processing circuit then performs depth detection to generate a depth map, which can be output as a resultant depth map or combined to create a combined depth map.

Career Highlights

Throughout his career, Yi Hung has worked with prominent companies such as Himax Technologies, Inc. and Liqxtal Technology Inc. His experience in these organizations has contributed to his expertise in developing advanced technologies.

Collaborations

Yi Hung has collaborated with notable colleagues, including Biing-Seng Wu and Pen-Hsin Chen. Their teamwork has likely fostered innovation and advancements in their respective fields.

Conclusion

Yi Hung's contributions to hybrid depth detection technology exemplify his innovative spirit and dedication to advancing the field. His work continues to influence the development of new technologies in depth detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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