Yi-hsien Chen

Title: Yi-hsien Chen’s Probe Card Inventions

Introduction

Yi-hsien Chen is an inventor based in Taoyuan, Taiwan. His work includes probe-card technologies designed to establish electrical contact with devices under test. Chen is associated with Chunghwa Precision Test Tech. Co., Ltd. and has 2 patents in the information provided.

Latest Patents

Chen’s listed patents focus on probe structures that use elastic members to maintain contact and generate force during testing.

“Probe card device and tunnel-type probe thereof” describes a tunnel-type probe with a tube, an elastic member, and a movable pin. The pin connects electrically to the tube through the elastic member. When its contacting segment presses against a device under test, the pin moves and deforms the elastic member, which generates an elastic force.

“Vertical probe card and open-type probe thereof” describes an open-type probe with a frame, an elastic member, and a pin. The pin’s inner segment sits in the frame’s operation slot, while its contacting segment extends outward to touch a device under test. Contact moves the pin toward the slot and presses the elastic member, producing an elastic force.

Career Highlights

The two listed inventions address probe-card contact mechanisms, with one using a tunnel-type structure and the other an open-type structure. Both designs describe elastic components that support pin movement and help generate force during testing.

Collaborations

Chen’s listed coworkers include Yu-ju Lu and Meng-chieh Cheng. His company affiliation is Chunghwa Precision Test Tech. Co., Ltd.

Conclusion

Yi-hsien Chen’s listed patent work centers on tunnel-type and open-type probes that use elastic members to support electrical contact and testing.