Palo Alto, CA, United States of America

Yi Cheng

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hewlett Packard Enterprise Development LP. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Cheng. Retrieved from https://idiyas.com/inventor/yi-cheng-3vf712fn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yi Cheng

Introduction

Yi Cheng is an accomplished inventor based in Palo Alto, CA. He has made significant contributions to the field of technology, particularly with his innovative patent related to latency measurement. His work is instrumental in enhancing the efficiency of data transmission and network performance.

Latest Patents

Yi Cheng holds a patent for a latency measurer. This device is designed to receive packets from a tapping point, which may include wrapped packets featuring a wrapper header. The wrapper header contains essential information such as a capture timestamp, a tapping point identifier, packet address and port information, and a message content hash. This invention is crucial for accurately measuring latency in network communications.

Career Highlights

Yi Cheng is currently employed at Hewlett Packard Enterprise Development LP, where he continues to innovate and develop cutting-edge technologies. His expertise in latency measurement has positioned him as a valuable asset to his team and the company.

Collaborations

Throughout his career, Yi Cheng has collaborated with notable colleagues, including Paul Michael Burke and Ruben Rodriguez Alvarez. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

In summary, Yi Cheng is a prominent inventor whose work in latency measurement has made a significant impact in the technology sector. His contributions at Hewlett Packard Enterprise Development LP and collaborations with esteemed colleagues highlight his dedication to innovation and excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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