Campbell, CA, United States of America

Yi Amy Xia


Average Co-Inventor Count = 42.9

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):

Title: Yi Amy Xia: Innovator in Test Architecture

Introduction

Yi Amy Xia is a prominent inventor based in Campbell, CA (US). She has made significant contributions to the field of electronic testing and validation. Her innovative work has led to the development of a unique architecture that enhances the testing and debugging processes for electronic devices.

Latest Patents

Yi Amy Xia holds a patent for a "Test, validation, and debug architecture." This invention describes an apparatus and method that provides a comprehensive test, validation, and debug architecture. At its core, hardware hooks, known as Design for Test (DFx), are integrated into silicon parts. A controller offers abstracted access to these hooks through an abstraction layer, which simplifies the low-level details of the hardware DFx. The abstraction layer, via an interface such as APIs, provides services, routines, and data structures to higher-level software layers. This allows for the collection of test data necessary for the validation and debugging of a unit or platform under test. Furthermore, the architecture offers tiered secure access to the test architecture and simplifies physical access through a unified, bi-directional test access port. This innovation also enables remote testing and debugging capabilities for electronic parts, devices, and platforms.

Career Highlights

Yi Amy Xia is currently employed at Intel Corporation, where she continues to push the boundaries of electronic testing technology. Her work has been instrumental in advancing the capabilities of testing architectures, making them more efficient and accessible.

Collaborations

Throughout her career, Yi has collaborated with notable colleagues, including Mark B Trobough and Keshavan K Tiruvallur. These collaborations have further enriched her contributions to the field.

Conclusion

Yi Amy Xia is a trailblazer in the realm of test architecture, with her innovative patent significantly impacting the electronic testing landscape. Her work at Intel Corporation exemplifies her commitment to advancing technology and improving testing methodologies.

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