This inventor holds 1 USPTO granted patent. Top assignee: Altera Corporation. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Yew Mun Chan and Integrated Circuit Die Selection
Introduction
Yew Mun Chan is an inventor associated with Ipoh, Malaysia, and Altera Corporation. His patent work concerns methods for identifying integrated circuit dies that meet specified performance criteria.
Latest Patents
Chan is credited with 1 patent: “Methods for Selecting Integrated Circuit Dies Based on Pre-Determined Criteria.” The disclosed method uses binning tools to characterize integrated circuit dies according to performance attributes and labels each die with an identifier corresponding to its location in a storage structure. A user can enter a performance description into testing equipment, which retrieves matching identifiers and directs a tester to screen the corresponding physical die locations.
Career Highlights
Chan’s listed invention addresses the selection of integrated circuit dies based on predetermined performance requirements. The approach connects performance grading, die-location identifiers, and tester screening to help locate dies that match a user’s criteria.
Collaborations
Chan’s listed coworkers include Azni Abd Rahman and Teng Chow Ooi. His patent is associated with Altera Corporation.
Conclusion
Yew Mun Chan’s patent describes a structured method for finding integrated circuit dies that meet specified performance criteria, linking die characterization and storage information with targeted testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile