Seoul, South Korea

Yeu Min Yoon

This inventor holds 2 USPTO granted patents. Top assignee: Kt Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yeu Min Yoon. Retrieved from https://idiyas.com/inventor/yeu-min-yoon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2016

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2 patents (USPTO):Explore Patents

Title: Yeu Min Yoon: Innovator in Embedded UICC Technology

Introduction

Yeu Min Yoon is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of embedded Universal Integrated Circuit Card (eUICC) technology. With a total of 2 patents, Yoon's work focuses on enhancing the management of profiles and security domains in smartcards.

Latest Patents

Yeu Min Yoon's latest patents include a method for managing multiple profiles in an embedded UICC and a method for modifying rights to a security domain for smartcards. The first patent addresses the efficient management of profiles stored in an eUICC, particularly in scenarios where multiple profiles are present. The second patent relates to a server and method for modifying rights to a security domain, enhancing the functionality and security of smartcards.

Career Highlights

Yoon is currently employed at KT Corporation, where he continues to innovate in the field of telecommunications and smartcard technology. His work has been instrumental in advancing the capabilities of embedded systems.

Collaborations

Some of his notable coworkers include Jin Hyoung Lee and Youn Pil Jeung, who contribute to the collaborative environment at KT Corporation.

Conclusion

Yeu Min Yoon's contributions to eUICC technology and smartcard security demonstrate his commitment to innovation in the telecommunications sector. His patents reflect a deep understanding of the complexities involved in managing digital profiles and security domains.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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