Seoul, South Korea

Yeonjae Kang

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Lg Electronics Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yeonjae Kang. Retrieved from https://idiyas.com/inventor/yeonjae-kang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Yeonjae Kang: Innovator in Sample Analysis Technology

Introduction: Yeonjae Kang is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of sample analysis technology. His innovative work focuses on improving the accuracy of measurements in microfluidic systems.

Latest Patents: Yeonjae Kang holds a patent for a sample analysis cartridge and a sample analysis cartridge reader. This invention enhances the measurement of specific components in samples flowing through microfluidic channels. By incorporating a numerical value of hematocrit, his invention significantly improves measurement accuracy.

Career Highlights: Yeonjae Kang is currently employed at LG Electronics Inc., where he continues to develop cutting-edge technologies. His work has positioned him as a key player in the field of microfluidics and sample analysis.

Collaborations: Some of his notable coworkers include Keumcheol Kwak and Seokjung Hyun. Their collaborative efforts contribute to the advancement of innovative solutions in their respective fields.

Conclusion: Yeonjae Kang's contributions to sample analysis technology exemplify the impact of innovation in improving measurement accuracy. His work at LG Electronics Inc. and his patented inventions highlight his role as a leading inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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