Taoyuan, Taiwan

Yen-Fu Chang

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2020.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yen-Fu Chang: Innovator in Thermal Estimation Technology

Introduction

Yen-Fu Chang is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of thermal estimation technology. His innovative approach has led to the development of a unique thermal estimation device and method.

Latest Patents

Yen-Fu Chang holds 1 patent for his invention titled "Thermal estimation device and thermal estimation method." This patent describes an embodiment of a thermal estimation device that includes a temperature model generator, a temperature gradient calculator, and a thermal sensing analyzer. The temperature model generator creates a temperature model based on initial parameters such as power consumption, area, and coordination of a circuit module. The temperature gradient calculator substitutes various testing parameters into the temperature model to estimate a temperature estimation function. The thermal sensing analyzer then differentiates this function to optimize parameters for accurate thermal estimation.

Career Highlights

Yen-Fu Chang is associated with the Industrial Technology Research Institute, where he continues to advance his research and development efforts. His work focuses on enhancing thermal estimation technologies that can be applied in various industries.

Collaborations

Yen-Fu Chang collaborates with esteemed colleagues, including Yao-Hua Chen and Jai-Ming Lin, who contribute to his research initiatives and projects.

Conclusion

Yen-Fu Chang's innovative work in thermal estimation technology showcases his dedication to advancing engineering solutions. His contributions are significant in the realm of thermal management and optimization.

Profile summary based on public USPTO records.
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