Beijing, China

Yehe Cai

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Beijing Voyager Technology Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yehe Cai. Retrieved from https://idiyas.com/inventor/yehe-cai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yehe Cai: Innovator in Environmental Detection Systems

Introduction

Yehe Cai is a prominent inventor based in Beijing, China. He has made significant contributions to the field of environmental detection systems for vehicles. His innovative approach combines advanced imaging and LiDAR technology to enhance vehicle awareness of surrounding objects.

Latest Patents

Yehe Cai holds a patent for "Methods and systems for detecting environmental information of a vehicle." This patent describes a system that utilizes a camera to capture images and LiDAR to gather point data. The system processes this information to determine 3D coordinates and reflection intensities, ultimately classifying surrounding objects based on the data collected.

Career Highlights

Cai is associated with Beijing Voyager Technology Co., Ltd., where he applies his expertise in developing cutting-edge technologies. His work focuses on improving vehicle safety and navigation through enhanced environmental detection.

Collaborations

Yehe Cai collaborates with talented individuals such as Weilong Yao and Zenan Meng. Together, they contribute to the advancement of innovative technologies in the automotive sector.

Conclusion

Yehe Cai's work exemplifies the intersection of technology and safety in the automotive industry. His contributions are paving the way for smarter and safer vehicles in the future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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