Beijing, China

Yefu Li

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yefu Li. Retrieved from https://idiyas.com/inventor/yefu-li-1kra50yi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yefu Li: Innovator in X-ray Imaging Technology

Introduction

Yefu Li is a prominent inventor based in Beijing, China. He has made significant contributions to the field of X-ray imaging technology. His innovative approach has led to the development of a unique cooling system for X-ray detectors.

Latest Patents

Yefu Li holds a patent for an X-ray detector cooling system and an X-ray imaging system. This invention provides a cooling system that operates without a refrigeration machine for an X-ray detector. The cooling system comprises a cooling pipeline positioned on the X-ray detector and a coolant transfer pipeline that forms a circulation loop. This design allows for the removal of the refrigeration machine from the cooling system while still meeting the temperature requirements for normal detector operation, ultimately reducing costs.

Career Highlights

Yefu Li is associated with General Electric Company, where he applies his expertise in developing advanced imaging technologies. His work has been instrumental in enhancing the efficiency and effectiveness of X-ray systems.

Collaborations

Yefu Li has collaborated with notable colleagues, including Hailiang Liu and Min Zhou. Their combined efforts have contributed to the advancement of innovative solutions in the field of imaging technology.

Conclusion

Yefu Li's contributions to X-ray imaging technology exemplify the impact of innovative thinking in the medical field. His patented cooling system represents a significant advancement that enhances the functionality of X-ray detectors while reducing operational costs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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