Shenzhen, China

Ye Yao

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Honor Device Co., Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ye Yao. Retrieved from https://idiyas.com/inventor/ye-yao-dkis52ku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Ye Yao - Innovator in Dark Circle Detection Technology

Introduction

Ye Yao is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of image processing, particularly in the detection and evaluation of dark circles. His innovative approach has led to the development of a unique patent that addresses a common cosmetic concern.

Latest Patents

Ye Yao holds a patent for a "Dark circle detection and evaluation method and apparatus." This method involves obtaining a to-be-processed image, extracting a dark circle region of interest, and performing color clustering to identify various colors within that region. The process culminates in recognizing the dark circle and obtaining an evaluation result based on the analysis.

Career Highlights

Ye Yao is currently employed at Honor Device Co., Ltd., where he continues to push the boundaries of technology in image processing. His work has garnered attention for its practical applications in beauty and health industries.

Collaborations

Ye Yao collaborates with talented individuals such as Chen Dong and Xin Ding, who contribute to his innovative projects and research endeavors.

Conclusion

Ye Yao's contributions to dark circle detection technology exemplify the impact of innovation in addressing everyday challenges. His work not only enhances image processing techniques but also improves the quality of life for many individuals.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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