Hangzhou, China

Ye Wu

This inventor holds 1 USPTO granted patent. Top assignee: Dobi Global, LLC. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ye Wu. Retrieved from https://idiyas.com/inventor/ye-wu-9ar2xxww

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ye Wu - Innovator in Breast Imaging Technology

Introduction

Ye Wu is a prominent inventor based in Hangzhou, China. She has made significant contributions to the field of medical imaging, particularly in breast imaging technology. Her innovative approach combines different imaging modalities to enhance diagnostic capabilities.

Latest Patents

Ye Wu holds a patent for a "Dual mode three-dimensional breast imaging device and method." This invention utilizes an ultrasonic detection device alongside a diffuse optical tomography (DOT) detection device. The method is designed to detect changes in tissue blood oxygen, providing both functional images and structural information of the breast simultaneously.

Career Highlights

Ye Wu is currently associated with Dobi Global, LLC, where she continues to develop cutting-edge technologies in medical imaging. Her work has been instrumental in advancing the capabilities of breast imaging, making it more effective for early detection and diagnosis.

Collaborations

Ye Wu collaborates with talented professionals in her field, including Ruowen Rong and Hongtao Wang. These partnerships enhance the innovation process and contribute to the development of new technologies.

Conclusion

Ye Wu's contributions to breast imaging technology exemplify the impact of innovative thinking in healthcare. Her work not only advances medical imaging but also improves patient outcomes through enhanced diagnostic methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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