Zhangjiagang, China

Ye Chen

This inventor holds 1 USPTO granted patent. Top assignee: Multidimension Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ye Chen. Retrieved from https://idiyas.com/inventor/ye-chen-6rjmeaku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ye Chen and a Current Measurement Innovation.

Introduction

Ye Chen is an inventor associated with Zhangjiagang, China, and Multidimension Technology Co., Ltd. The supplied information identifies her work on a current measurement device designed to reduce interference from external magnetic fields.

Latest Patents

The provided data lists 1 patent for Ye Chen: “Current Measurement Device.” The invention uses magnetoresistances arranged at three or more positions, with at least two magnetoresistances at each position oriented in opposite sensitive directions. Their resistance values vary linearly with the magnetic field within a specified range. The arrangement forms a resistance network that produces an output representing the magnetic fields being measured while excluding, or limiting, the contribution of interference magnetic fields. This design aims to improve current measurement by reducing magnetic interference.

Career Highlights

Ye Chen’s listed patent reflects work on magnetic sensing and current measurement. Her affiliation with Multidimension Technology Co., Ltd. connects this invention to the company’s technology development.

Collaborations

The supplied information names Haiping Guo and Chen Song as Ye Chen’s coworkers. It does not specify their roles in developing or patenting the current measurement device.

Conclusion

Ye Chen’s listed invention addresses a practical challenge in current sensing by using a magnetoresistance network to reduce interference from external magnetic fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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