Hachioji, Japan

Yausunobu Matsuoka

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yausunobu Matsuoka. Retrieved from https://idiyas.com/inventor/yausunobu-matsuoka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Yausunobu Matsuoka and Superlattice Avalanche Photodiode Innovation.

Introduction

Yausunobu Matsuoka is an inventor associated with Hachioji, Japan, and Hitachi, Ltd. His recorded patent work concerns the design of a superlattice avalanche photodiode.

Latest Patents

Matsuoka is associated with 1 patent, titled “Superlattice Avalanche Photodiode (APD).” The invention describes an APD with a light-absorption layer that generates carriers by absorbing light, a multiplication layer that multiplies those carriers, and a pair of electrodes that drive them. The multiplication layer uses alternating superlattice well and barrier layers: the well layer is less than 10 nm thick, while the barrier layer is more than 10 nm and less than 20 nm thick.

Career Highlights

Matsuoka’s listed patent reflects work on semiconductor photodetector structures and the engineering of carrier multiplication. The available information identifies Hitachi, Ltd. as his company affiliation.

Collaborations

Hitoshi Nakamura and Shoichi Hanatani are listed as Matsuoka’s coworkers. The provided information does not specify their roles in the patent.

Conclusion

Yausunobu Matsuoka’s recorded invention focuses on a carefully layered superlattice structure for an avalanche photodiode, connecting his patent work with Hitachi, Ltd. and semiconductor device innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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