Company Filing History:
Years Active: 2024
Title: Yatfei Chan: Innovator in Inspection Technology
Introduction
Yatfei Chan is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of inspection systems.
Latest Patents
Yatfei Chan holds a patent for an "Inspection system, inspection method, and inspection program." This invention includes a memory and a processor. The memory is designed to hold an image reproducing model that can reproduce a first image from a masked version of that image. The processor determines whether a new image includes a defect by comparing it to the reproduced image.
Career Highlights
Yatfei Chan is currently employed at Nitto Denko Corporation, where he applies his expertise in developing advanced inspection technologies. His work has been instrumental in improving the quality control processes within the company.
Collaborations
Yatfei Chan collaborates with his coworker, Yoichi Kigawa, to further enhance their research and development efforts in inspection systems.
Conclusion
Yatfei Chan's innovative contributions to inspection technology demonstrate his commitment to advancing the field. His patent reflects a significant step forward in ensuring the quality and reliability of inspected objects.