The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Jan. 20, 2022
Nitto Denko Corporation, Ibaraki, JP;
Yoichi Kigawa, Osaka, JP;
Yatfei Chan, Osaka, JP;
NITTO DENKO CORPORATION, Ibaraki, JP;
Abstract
An inspection system includes a memory; and a processor, wherein the memory is configured to hold an image reproducing model trained to reproduce, from a first masked image generated by masking part, of a first image determined as including no defect from among images that capture an object to be inspected, the first image before being masked, and wherein the processor is configured to determine, based on a reproduced image reproduced by inputting a second masked image generated by masking part of a second image that captures a new object to be inspected into the image reproducing model, and the second image, whether the second image includes a defect.