Yasutomo Doi

Title: Yasutomo Doi: Innovator in Inspection Technology

Introduction

Yasutomo Doi is a notable inventor based in Fukuchiyama, Japan. He has made significant contributions to the field of inspection technology, particularly in the area of automated inspection of fillet shapes on substrates. His innovative approach has led to the development of a patented method that enhances the accuracy and efficiency of inspections.

Latest Patents

Yasutomo Doi holds a patent for a "Method of setting reference data for inspection of fillets and inspection device using same." This patent involves a sophisticated process for automatically inspecting the shapes of fillets formed on a substrate. The method includes setting reference data that correlates with the heights of solder used to form various fillet shapes. By utilizing an inspection device that illuminates the substrate from specific directions, the system generates images that facilitate accurate inspections.

Career Highlights

Doi is currently employed at Omron Corporation, a leading company in automation and control technology. His work at Omron has allowed him to apply his innovative ideas in practical settings, contributing to advancements in inspection devices and methodologies. His expertise in this field has positioned him as a valuable asset to his team and the company.

Collaborations

Throughout his career, Yasutomo Doi has collaborated with esteemed colleagues, including Yoshiki Fujii and Akira Nakajima. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Yasutomo Doi's contributions to inspection technology exemplify the impact of innovation in enhancing industrial processes. His patented methods and collaborative efforts continue to influence the field, showcasing the importance of creativity and teamwork in driving technological advancements.