The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Jul. 20, 2007
Yoshiki Fujii, Nagaokakyo, JP;
Yasutomo Doi, Fukuchiyama, JP;
Akira Nakajima, Otsu, JP;
Toshihiro Moriya, Nara, JP;
Yasuaki Nakajima, Takatsuki, JP;
Yoshiki Fujii, Nagaokakyo, JP;
Yasutomo Doi, Fukuchiyama, JP;
Akira Nakajima, Otsu, JP;
Toshihiro Moriya, Nara, JP;
Yasuaki Nakajima, Takatsuki, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.