Company Filing History:
Years Active: 2009-2012
Title: Yasutaka Arakawa: Innovator in Semiconductor Testing Technology
Introduction
Yasutaka Arakawa is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of semiconductor testing technology. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of wafer probe tests.
Latest Patents
Arakawa's latest patents include a probe device, processing device, and probe testing method. This innovation provides a probe device that features multiple measuring stages, each connected to different probe cards for inspecting semiconductor wafers. The design includes a first conveying portion that transports a semiconductor wafer to the first measuring stage, where the first probe card is connected. Additionally, a first inspection control portion manages the inspection process. The device also incorporates a receiving portion that gathers stage information, allowing for efficient operation by conveying the wafer to a second measuring stage as needed.
Another notable patent is a defect detection system, which comprises a data acquiring section that collects time series data from manufacturing devices, including exposure devices. This system classifies defect distributions and calculates feature quantities to identify the causes of defects effectively.
Career Highlights
Yasutaka Arakawa is currently employed at Kabushiki Kaisha Toshiba, where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in advancing the capabilities of defect detection and wafer testing.
Collaborations
Arakawa collaborates with notable colleagues, including Hiroshi Matsushita and Junji Sugamoto. Their combined expertise contributes to the success of their projects and innovations.
Conclusion
Yasutaka Arakawa's contributions to semiconductor testing technology exemplify his commitment to innovation. His patents reflect a deep understanding of the complexities involved in wafer probe testing and defect detection. Through his work at Toshiba and collaborations with esteemed colleagues, Arakawa continues to push the boundaries of technology in this critical field.