Kyoto, Japan

Yasushi Oshima

This inventor holds 1 USPTO granted patent. Top assignee: Screen Holdings Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasushi Oshima. Retrieved from https://idiyas.com/inventor/yasushi-oshima-bt5y0z59

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yasushi Oshima: Innovator in Inkjet Printing Technology

Introduction

Yasushi Oshima is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of inkjet printing technology. His innovative approach has led to advancements that enhance the efficiency and effectiveness of printing processes.

Latest Patents

Oshima holds a patent for an "Inkjet printing apparatus and head inspection method." This invention involves a controller that outputs a test drive signal for printing a test pattern to a piezoelectric element of a head. The test drive signal includes a first frequency corresponding portion where first and second waveforms are combined in a first ratio, and a second frequency corresponding portion where the waveforms are combined in a different ratio. This method allows for the inspection of the head for abnormalities while maintaining a constant speed of the recording medium.

Career Highlights

Yasushi Oshima is associated with Screen Holdings Co., Ltd., a company known for its innovations in printing technology. His work has been instrumental in developing solutions that improve the quality and reliability of inkjet printing systems.

Conclusion

Yasushi Oshima's contributions to inkjet printing technology exemplify the impact of innovative thinking in the field. His patent reflects a commitment to enhancing printing processes and ensuring high-quality outputs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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