Sagamihara, Japan

Yasushi Fukutomi


Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 24(Granted Patents)


Location History:

  • Kawasaki, JP (1994)
  • Sagamihara, JP (2005)

Company Filing History:


Years Active: 1994-2005

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2 patents (USPTO):Explore Patents

Title: Innovations of Yasushi Fukutomi

Introduction

Yasushi Fukutomi is a notable inventor based in Sagamihara, Japan. He has made significant contributions to the field of optical measurement and microscopy. With a total of 2 patents, his work has advanced the understanding and application of precision measurement techniques.

Latest Patents

Fukutomi's latest patents include a "Method and apparatus for point diffraction interferometry." This innovative method involves forming a substantially ideal spherical wave using a point light source-generating unit. The light flux, composed of this spherical wave, passes through a test sample and is divided into two light fluxes using an optical path-dividing element. One of these light fluxes is converted into a reference light beam, allowing for the detection of interference fringes. This technique enables the measurement of wavefront aberration without being affected by disturbances such as system vibrations.

Another significant invention is the "Scanning probe microscope." This device achieves atomic-level resolving power and includes a probe microscope unit for measuring the fine constitution of a sample surface. The optical microscope unit allows for the observation of optical images of the sample. The probe microscope unit is encased in a noise and electromagnetic wave-shielded box, designed in the shape of a triangular cone, which enhances its measurement capabilities.

Career Highlights

Fukutomi is currently employed at Nikon Corporation, a leading company in imaging and optical products. His work at Nikon has allowed him to focus on developing advanced measurement technologies that have practical applications in various scientific fields.

Collaborations

Throughout his career, Fukutomi has collaborated with esteemed colleagues such as Hiroyuki Matsushiro and Tetsuji Onuki. These collaborations have fostered an environment of innovation and have contributed to the success of his projects.

Conclusion

Yasushi Fukutomi's contributions to optical measurement and microscopy demonstrate his expertise and commitment to innovation. His patents reflect a deep understanding of complex scientific principles and their practical applications. His work continues to influence the field and inspire future advancements.

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