Ebina, Japan

Yasuo Ebizuka


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Yasuo Ebizuka: Innovator in Electromagnetic Noise Measurement

Introduction

Yasuo Ebizuka is a notable inventor based in Ebina, Japan. He has made significant contributions to the field of electromagnetic noise measurement. His work focuses on enhancing measurement efficiency and preventing erroneous measurements in this critical area of technology.

Latest Patents

Yasuo Ebizuka holds a patent for an "Electromagnetic noise measurement apparatus, electromagnetic noise measurement method and recording medium." The objective of this invention is to provide a reliable method for measuring electromagnetic noise. The apparatus includes a PC, a field intensity meter, a spectrum analyzer, a preamplifier, a controller, and a printer. The controller is designed to manage a turntable and an antenna elevator, which are essential for measuring electromagnetic noise emitted from devices such as copying machines. The system is capable of displaying error messages when discrepancies in measurements occur, thereby enhancing the accuracy of the results.

Career Highlights

Yasuo Ebizuka is currently employed at Fuji Xerox Co., Ltd. His work at this esteemed company has allowed him to develop innovative solutions that address challenges in electromagnetic noise measurement. His expertise in this field has positioned him as a valuable asset to his organization.

Collaborations

Yasuo has collaborated with notable colleagues, including Masayuki Hirata and Kazunori Yamada. Their combined efforts have contributed to advancements in the technology surrounding electromagnetic noise measurement.

Conclusion

Yasuo Ebizuka's contributions to the field of electromagnetic noise measurement demonstrate his commitment to innovation and efficiency. His patent reflects a significant advancement in the technology, showcasing his expertise and dedication to improving measurement methods.

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