The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2003
Filed:
Nov. 24, 2000
Yasuo Ebizuka, Ebina, JP;
Masayuki Hirata, Ebina, JP;
Kazunori Yamada, Tokyo, JP;
Haruo Shinozaki, Yokohama, JP;
Toru Matsuzaki, Yokohama, JP;
Takaji Morita, Tokyo, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
The object of the present invention is to provide an electromagnetic noise measurement apparatus, electromagnetic noise measurement method and recording medium capable of preventing erroneous measurement of electromagnetic noise and of enhancing measurement efficiency. An electromagnetic noise measurement apparatus includes a PC, a field intensity meter, a spectrum analyzer, a preamplifier, a controller, a printer and the like. The controller is connected to a turn table for turning an electromagnetic noise measurement target, e.g., a copying machine, and to an antenna elevator for elevating an antenna for measuring electromagnetic noise radiated from the copying machine. The controller controls the turn table and the antenna elevator according to command of the PC. The PC compares a QP value acquired by the field intensity meter with a peak level acquired by the spectrum analyzer, and displays an error message if the difference between the QP value and the peak level is large.