This inventor holds 22 USPTO granted patents, primarily in Camera Technology. Top assignee: Minolta Camera Kabushiki Kaisha. Active years: 1976-1993.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuhiro Nanba. Retrieved from https://idiyas.com/inventor/yasuhiro-nanba
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
Average Co-Inventor Count = 2.1
ph-index = 8
Forward Citations = 218(Granted Patents)
Location History:
- Sakai, JA (1976 - 1977)
- Toyokawa, JA (1976 - 1977)
- Sennan, JA (1977)
- Osaka, JA (1976 - 1978)
- Osaka, JP (1979 - 1984)
- Sennan, JP (1985)
- Toyonaka, JP (1993)
Company Filing History:
Years Active: 1976-1993
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Areas of Expertise:
Solid-State Image Sensor
Focus Detection
Rangefinding System
Automatic Exposure Control
Digital Exposure Meter
Light Measuring Circuit
Image Focusing Mechanism
Exposure Control Devices
Photoelectric Rangefinder
Distance Measuring Device
Automatic Focus Control
Exposure Time Control
22 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuhiro Nanba. Retrieved from https://idiyas.com/inventor/yasuhiro-nanba
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]