Hadano, Japan

Yasuhiro Fujishita

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuhiro Fujishita. Retrieved from https://idiyas.com/inventor/yasuhiro-fujishita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: **Innovator Yasuhiro Fujishita – Advancing Wiring Pattern Inspection Technology**

Introduction

Yasuhiro Fujishita, an accomplished inventor based in Hadano, Japan, has made significant contributions to the field of wiring pattern inspection technology. His innovative approach addresses the complexities of identifying defects in wiring patterns across multiple layers, showcasing his expertise and commitment to enhancing technological processes.

Latest Patents

Yasuhiro Fujishita holds a patent for a "Wiring Pattern Inspecting Method and System for Carrying Out the Same." This method involves irradiating a test object with x-rays to obtain a variable-density image signal that corresponds to the thickness of superposed wiring patterns. The system extracts image signals that reflect the number of superposed patterns and employs these signals to assess end point and isolated point information, ultimately enabling defect inspection in wiring patterns.

Career Highlights

Fujishita's career is marked by his association with Hitachi, Ltd., where he has made pivotal contributions to advancing inspection technologies. His innovative work not only reflects his technical skill but also underscores his role in enhancing product reliability and quality assurance in electronic manufacturing.

Collaborations

Throughout his career, Yasuhiro has collaborated with esteemed colleagues, including Yoko Irie and Hideaki Doi. These partnerships highlight the importance of teamwork in driving innovation and developing cutting-edge solutions in wiring inspection methodologies.

Conclusion

Yasuhiro Fujishita's contributions to wiring pattern inspection technology represent a significant advancement in the field. His patented method offers an effective approach to identifying defects, ensuring higher standards of quality in electronic manufacturing. As technology continues to evolve, innovators like Fujishita pave the way for future advancements, revealing the critical role of inventors in shaping industry practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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