Ritto, Japan

Yasuhiko Kanai

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ishida Co. Limited. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuhiko Kanai. Retrieved from https://idiyas.com/inventor/yasuhiko-kanai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yasuhiko Kanai: Innovator in Strain Gauge Technology

Introduction

Yasuhiko Kanai is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of strain gauge technology, particularly with his innovative designs that enhance measurement accuracy.

Latest Patents

Kanai holds a patent for an insulated strain gauge that reduces error-causing moisture incursion. This invention includes a substrate, a resistive body, and a metal sheet. The resistive body features a sensing portion, a first connection portion, and a second connection portion. The metal sheet is designed to cover at least the substrate that is exposed between two connection sites, which are connected to an external circuit.

Career Highlights

Yasuhiko Kanai is currently employed at Ishida Co. Limited, where he continues to develop and refine his inventions. His work has been instrumental in advancing the technology used in strain gauges, making them more reliable and efficient.

Collaborations

Kanai collaborates with fellow inventor Shinji Takeichi, contributing to the innovative environment at Ishida Co. Limited.

Conclusion

Yasuhiko Kanai's contributions to strain gauge technology exemplify the impact of innovative thinking in engineering. His patented designs not only improve measurement accuracy but also pave the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…