Tokyo, Japan

Yasaka Mitsuo

This inventor holds 1 USPTO granted patent. Top assignee: Tokyo Cathode Laboratory, Co., Ltd.. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasaka Mitsuo. Retrieved from https://idiyas.com/inventor/yasaka-mitsuo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Yasaka Mitsuo: Innovator in Semiconductor Technology

Introduction

Yasaka Mitsuo is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of semiconductor technology. Her innovative work has led to the development of a unique patent that enhances the accuracy of charge detection in semiconductor substrates.

Latest Patents

Mitsuo holds a patent for a "Charge detector for semiconductor substrates." This invention features a detecting electrode positioned opposite an article to be conveyed, along with an auxiliary electrode that is shielded from external electric fields. These components are connected to a field effect transistor through switch means. When the article passes the detecting electrode, charge is induced, which varies the gate electric field of the transistor according to the quantity of charge. This allows for an accurate measurement of the charged potential of the article being conveyed.

Career Highlights

Yasaka Mitsuo is currently employed at Tokyo Cathode Laboratory, Co., Ltd. Her role at the company allows her to further explore and develop her innovative ideas in semiconductor technology. With her expertise, she has been able to contribute to advancements in the industry.

Conclusion

Yasaka Mitsuo is a trailblazer in the field of semiconductor technology, with her patent showcasing her innovative spirit and technical prowess. Her work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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