Yaonan Wang

Title: Innovations of Yaonan Wang in Image Processing

Introduction

Yaonan Wang is a prominent inventor based in Nanchang, China. He has made significant contributions to the field of image processing, particularly in generating industrial defect images. His innovative approach utilizes advanced techniques to enhance the quality and accuracy of defect detection in industrial applications.

Latest Patents

Yaonan Wang holds a patent titled "Method for generating industrial defect image, device, medium, and product." This patent relates to the field of image processing and outlines a method that includes acquiring an industrial defect-free image and generating an industrial defect image using a defect image generation model. The model is constructed based on a cyclic Generative Adversarial Network (GAN) and comprises two generators and two discriminators. Each generator includes an encoder, a transformer, and a decoder connected in sequence. The encoder extracts features from the input image, the transformer applies a self-attention-based residual network, and the decoder utilizes a skip connection mechanism and deconvolution operations to produce the generated image. Yaonan Wang has 1 patent to his name.

Career Highlights

Yaonan Wang is affiliated with Nanchang Hangkong University, where he contributes to research and development in image processing technologies. His work has garnered attention for its practical applications in various industrial sectors.

Collaborations

Some of his notable coworkers include Congxuan Zhang and Shijie Zhang, who collaborate with him on various projects related to image processing and defect detection.

Conclusion

Yaonan Wang's innovative methods in generating industrial defect images represent a significant advancement in the field of image processing. His contributions continue to influence the industry and enhance the capabilities of defect detection technologies.