Nanchang Hangkong University

Yaonan Wang

Zhen Chen

Congxuan Zhang

Liyue Ge

Zige Wang

Leqi Jiang

Shijie Zhang

Chengzhong Wu

A method for generating an industrial defect image, a device, a medium, and a product are provided, relating to the field of image processing. The method includes: acquiring an industrial defect-free image; and generating an industrial defect image based on the industrial defect-free image by using a defect image generation model. The defect image generation model is constructed based on a cyclic Generative Adversarial Network (GAN); the defect image generation model includes two generators and two discriminators, with each generator including an encoder, a transformer, and a decoder connected in sequence; the encoder uses convolution operations to extract features from an input image, the transformer uses a self-attention-based residual network to transform an image output by the encoder, and the decoder uses a skip connection mechanism and deconvolution operations to decode an image output by the transformer to obtain a generated image.

Method for generating industrial defect image, device, medium, and product

Growing community of inventors

Nanchang, China

Yaonan Wang