Dalian, China

Yaohui Xue

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Dalian University of Technology. Active years: 2026.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Yaohui Xue in Surface-Wave Inversion Methods

Introduction

Yaohui Xue is a prominent inventor based in Dalian, China. He has made significant contributions to the field of geophysics, particularly in the area of surface-wave inversion methods. His innovative approaches address critical challenges in accurately characterizing subsurface properties.

Latest Patents

Yaohui Xue holds a patent for a "Multi-mode surface-wave free-field inversion method based on dispersion properties of layered media." This method tackles the inaccuracies found in existing techniques that often overlook higher modes. By proposing a novel approach that utilizes energy flux density, he has developed a way to calculate a modal participation factor through dispersion curves and the frequency-domain dynamic stiffness matrix. The method involves transforming ground surface-wave components from the time domain to the frequency domain using Fast Fourier Transform technology. This allows for the decomposition of these components into harmonic frequencies, which are then decoupled into multiple modes. Each single-mode component is inverted to create single-mode surface-wave free fields, which are ultimately superimposed to form multi-mode surface-wave free fields.

Career Highlights

Yaohui Xue is affiliated with Dalian University of Technology, where he continues to advance research in geophysical methods. His work has garnered attention for its innovative approach and practical applications in subsurface exploration.

Collaborations

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Conclusion

Yaohui Xue's contributions to surface-wave inversion methods represent a significant advancement in geophysical research. His innovative techniques enhance the accuracy of subsurface characterization, paving the way for future developments in the field.

Profile summary based on public USPTO records.
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