CUPERTINO, CA, United States of America

Yao-cheng Tien

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Pure Storage, Inc.. Active years: 2024-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yao-cheng Tien. Retrieved from https://idiyas.com/inventor/yao-cheng-tien-xvh23lbf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024-2025

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2 patents (USPTO):Explore Patents

Title: Yao-cheng Tien: Innovator in Data Replication Verification

Introduction

Yao-cheng Tien is a notable inventor based in Cupertino, California. He has made significant contributions to the field of data replication and verification. His innovative work has led to the development of a patent that addresses critical aspects of data integrity.

Latest Patents

Yao-cheng Tien holds a patent titled "Verifying data has been correctly replicated to a replication target." This patent outlines a method for ensuring that data replicated from one computing system to another is valid. The process involves generating hashes from datasets stored on both systems and comparing them to confirm the accuracy of the replication.

Career Highlights

Yao-cheng Tien is currently employed at Pure Storage, Inc., where he applies his expertise in data management and replication technologies. His work at the company has positioned him as a key player in advancing data storage solutions.

Collaborations

Some of Yao-cheng Tien's coworkers include David A Grunwald and Luke Paulsen. Their collaborative efforts contribute to the innovative environment at Pure Storage, Inc.

Conclusion

Yao-cheng Tien's contributions to data replication verification highlight his role as an influential inventor in the tech industry. His patent reflects a commitment to ensuring data integrity in modern computing systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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