Hong Kong, China

Yanping He

This inventor holds 1 USPTO granted patent. Top assignee: The Chinese University of Hong Kong. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yanping He. Retrieved from https://idiyas.com/inventor/yanping-he-l9b395as

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yanping He: Innovator in Cell Tomography

Introduction

Yanping He is a prominent inventor based in Hong Kong, CN. She has made significant contributions to the field of cell tomography, particularly with her innovative approach to label-free imaging techniques. Her work is instrumental in advancing medical imaging technologies.

Latest Patents

Yanping He holds a patent for a groundbreaking invention titled "High Speed Single-Frame Label-Free Cell Tomography." This patent represents a significant advancement in the ability to visualize cells without the need for labeling, which can often interfere with the natural state of the cells being studied. She has 1 patent to her name.

Career Highlights

Yanping He is affiliated with The Chinese University of Hong Kong, where she conducts her research and development in cell imaging technologies. Her academic and professional journey has been marked by a commitment to innovation and excellence in her field.

Collaborations

Throughout her career, Yanping has collaborated with esteemed colleagues, including Renjie Zhou and Peter TC So. These collaborations have further enriched her research and contributed to the advancement of cell tomography.

Conclusion

Yanping He is a trailblazer in the field of cell tomography, with her innovative patent and collaborative efforts paving the way for future advancements in medical imaging. Her contributions are vital to the ongoing evolution of this important scientific discipline.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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