Ecublens, Switzerland

Yann Chevolot

This inventor holds 1 USPTO granted patent. Top assignee: Centre Suisse D'electronique Et De Microtechnique Sa. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yann Chevolot. Retrieved from https://idiyas.com/inventor/yann-chevolot-flokl7fp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Yann Chevolot: Innovator in Surface Modification

Introduction

Yann Chevolot is a notable inventor based in Ecublens, Switzerland. He has made significant contributions to the field of surface modification through his innovative processes. With a focus on enhancing material properties, his work has implications across various industries.

Latest Patents

Yann Chevolot holds one patent titled "Process for the modification of surface." This patent showcases his expertise in developing methods that improve the functionality and durability of surfaces in different applications.

Career Highlights

Chevolot is associated with the Centre Suisse d'Électronique et de Microtechnique SA, where he applies his knowledge and skills to advance technology in microelectronics and related fields. His work at this institution has positioned him as a key player in the innovation landscape.

Collaborations

Some of his notable coworkers include Hans Sigrist and David Crout. Their collaborative efforts contribute to the success of projects at the Centre Suisse d'Électronique et de Microtechnique SA.

Conclusion

Yann Chevolot's contributions to surface modification and his role at the Centre Suisse d'Électronique et de Microtechnique SA highlight his importance in the field of innovation. His work continues to influence advancements in technology and materials science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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