Kunshan, China

Yanling Liu

This inventor holds 1 USPTO granted patent. Top assignee: Kunshan Go-Visionox Opto-Electronics Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yanling Liu. Retrieved from https://idiyas.com/inventor/yanling-liu-pnbeuwj0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Yanling Liu: Innovator in Display Technology

Introduction

Yanling Liu is a prominent inventor based in Kunshan, China. She has made significant contributions to the field of display technology. Her innovative work focuses on methods and apparatuses that enhance the testing and performance of display panels.

Latest Patents

Yanling Liu holds a patent for a "Method and apparatus for detecting bending stiffness and method for testing display panel." This invention provides a systematic approach to assess the bending stiffness of display panels. The method involves arranging an object to be tested on a reference surface, allowing for precise measurements of bending force and rotation angle. This data is crucial for determining the bending stiffness of the tested object.

Career Highlights

Yanling Liu is associated with Kunshan Go-visionox Opto-electronics Co., Ltd., where she applies her expertise in display technology. Her work has been instrumental in advancing the capabilities of display panels, making them more reliable and efficient.

Collaborations

She collaborates with talented colleagues, including Pengle Dang and Yuliang Li, who contribute to her innovative projects. Their teamwork fosters a creative environment that drives technological advancements in their field.

Conclusion

Yanling Liu's contributions to display technology through her patent and collaborative efforts highlight her role as an influential inventor. Her work continues to impact the industry positively, paving the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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