Yanjia Sun is a prominent inventor based in Downingtown, PA (US), known for his contributions to data mining and performance monitoring technologies. With a total of 5 patents, he has made significant strides in the field of computer science and engineering.

Latest Patents

One of Yanjia Sun's latest patents is titled "Distributed FP-growth with node table for large-scale association rule mining." This invention relates to technology for mining data in a database by recursively mining a conditional frequent pattern tree (FP-tree) for frequent items of each conditional pattern base for each node in an FP-tree to obtain frequent patterns. For each branch in the FP-tree, a single-item node table (NT) is generated for which a selected one of the frequent items appears in the node of the branch. The single-item NT includes a list of all of the frequent items appearing in the FP-tree and a corresponding frequent item count. For each single-item NT of each branch generated for the selected one of the frequent items, the frequent item count of each frequent item is summed in the single-item NT formed for each branch to generate a combined single-item NT, and association rules based on the frequent patterns are generated for each of the frequent items and the combined single-item NT.

Another notable patent is "User-level KQI anomaly detection using Markov chain model." This invention provides techniques for monitoring the performance of a user device in a communication network. The techniques include detecting an anomaly in a performance measurement such as a key quality indicator (KQI) of the user device. The techniques involve obtaining historical measurements of the KQI for user devices, which are assigned to states to reflect whether the performance is good or bad, or somewhere in between. The states can be defined differently for different hours in the day so that they represent the relative performance for that time of day. For each user device, a Markov model is provided indicating probabilities of transitions between the states. Additional measurements are obtained of the KQI for a selected user device, and the Markov model of the selected user device is used to detect an anomaly in the additional measurements.

Career Highlights

Yanjia Sun is currently employed at Future Wei Technologies, Inc., where he continues to innovate and develop cutting-edge technologies. His work has significantly impacted the fields of data mining

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