The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Mar. 31, 2017
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Kai Yang, Great Neck, NJ (US);

Yanjia Sun, Downington, PA (US);

Ruilin Liu, Hillsborough, NJ (US);

Deti Liu, Plano, TX (US);

Jin Yang, Bridgewater, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06N 7/00 (2006.01); H04W 24/02 (2009.01); H04W 24/04 (2009.01); H04W 24/08 (2009.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06N 7/005 (2013.01); H04W 24/02 (2013.01); H04W 24/04 (2013.01); H04W 24/08 (2013.01); H04W 36/0022 (2013.01);
Abstract

Techniques are provided for monitoring the performance of a user device in a communication network. The techniques include detecting an anomaly in a performance measurement such as a key quality indicator (KQI) of the user device. The techniques include obtaining historical measurements of the KQI for user devices. The historical measurements are assigned to states to reflect whether the performance is good or bad, or somewhere in between. The states can be defined differently for different hours in the day so that the states represent the relative performance for that time of day. For each user device, a Markov model is provided indicating probabilities of transitions between the states. Additional measurements are obtained of the KQI for a selected user device, and the Markov model of the selected user device is used to detect an anomaly in the additional measurements.


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