Andover, MN, United States of America

Yanhua Li

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Engage Technologies Corp.. Active years: 2012-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yanhua Li. Retrieved from https://idiyas.com/inventor/yanhua-li-fw7v0d18

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2012-2013

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2 patents (USPTO):Explore Patents

Title: Yanhua Li - Innovator in Industrial Printing

Introduction

Yanhua Li is a notable inventor based in Andover, MN (US). He has made significant contributions to the field of industrial printing, holding a total of 2 patents. His work focuses on enhancing the efficiency and functionality of printing technologies.

Latest Patents

Yanhua Li's latest patents include an industrial printer and an industrial printer cartridge. These innovations are designed to improve the performance and reliability of printing systems in various industrial applications.

Career Highlights

Yanhua Li is currently employed at Engage Technologies Corporation, where he continues to develop cutting-edge printing solutions. His expertise in the field has positioned him as a key player in the advancement of industrial printing technologies.

Collaborations

Yanhua collaborates with Cris R. Miller, a talented woman in the industry. Together, they work on innovative projects that aim to push the boundaries of printing technology.

Conclusion

Yanhua Li's contributions to industrial printing through his patents and collaborations highlight his role as an influential inventor in the field. His work continues to shape the future of printing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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