Dongguan, China

Yangjun Wan

This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yangjun Wan. Retrieved from https://idiyas.com/inventor/yangjun-wan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yangjun Wan and Optical Network Fault Localization

Introduction

Yangjun Wan is an inventor associated with Dongguan, China, and Huawei Technologies Co., Ltd. His patent work addresses fault localization in optical networks, where accurate and efficient diagnosis can help reduce network complexity and improve troubleshooting.

Latest Patents

Wan is associated with 1 patent: “Fault Locating Method for Optical Network and Related Device.” The invention describes a method in which a network management device obtains a set of optical power measurements collected sequentially by an optical network device during a fault-localization period. At least one measurement is at or below a specified threshold. The management device analyzes the measurements’ changing trend to determine the type of fault in the optical network. The approach is intended to improve the accuracy and efficiency of fault localization while reducing its complexity.

Career Highlights

The available information connects Wan’s patent activity with Huawei Technologies Co., Ltd. His work on optical-network fault diagnosis reflects an engineering focus on using measured signal behavior to identify network problems.

Collaborations

Wan’s listed coworkers include Zhihong Jia and Hongfei Hu. Their names are associated with the provided information about his professional and patent context.

Conclusion

Yangjun Wan’s patent contribution focuses on a practical method for identifying optical-network faults from changing optical power measurements, with the goal of making diagnosis more accurate and efficient.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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